{"title":"如何利用工业3d计量中的先验知识","authors":"C. Faber, M. Strohmeier, Hanning Liang","doi":"10.1364/COSI.2019.CTH2A.6","DOIUrl":null,"url":null,"abstract":"The goal of every measurement is to obtain new information about the specimen - preferably with as little effort as possible. We will discuss different ways of exploiting prior knowledge to accomplish this goal in industrial environments.","PeriodicalId":123636,"journal":{"name":"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"How to Exploit Prior Knowledge in Industrial 3D-Metrology\",\"authors\":\"C. Faber, M. Strohmeier, Hanning Liang\",\"doi\":\"10.1364/COSI.2019.CTH2A.6\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The goal of every measurement is to obtain new information about the specimen - preferably with as little effort as possible. We will discuss different ways of exploiting prior knowledge to accomplish this goal in industrial environments.\",\"PeriodicalId\":123636,\"journal\":{\"name\":\"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/COSI.2019.CTH2A.6\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/COSI.2019.CTH2A.6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
How to Exploit Prior Knowledge in Industrial 3D-Metrology
The goal of every measurement is to obtain new information about the specimen - preferably with as little effort as possible. We will discuss different ways of exploiting prior knowledge to accomplish this goal in industrial environments.