面向高速IOs的网络行业ESD防护趋势

R. Wong, R. Fung, Shi-Jie Wen
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引用次数: 8

摘要

随着对更多数据的需求增加,网络应用程序中的数据速率也在增加。为了实现高性能,高速IOs的数据速率不断提高。这些高数据速率要求IO容量必须非常低。传统上,ESD保护结构很大,以处理大的瞬态电流。最近,高速IO限制了与ESD结构相关的电容,使得高速IO的ESD保护设计极具挑战性。本文将讨论网络行业在高速IOs方面的趋势、电容要求以及由此带来的ESD保护设计挑战。为了实现适当的ESD保护,芯片上的ESD保护方案需要改变和/或ESD保护规范可能需要降低目标保护水平。这是高速网络行业的一个热门话题,可能会极大地改变下一代ESD保护设计。我们将讨论高速IOs扩展趋势可能带来的ESD设计结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Networking industry trends in ESD protection for high speed IOs
Data rates in networking applications have increased as demand for more data increases. To achieve the high performance, the data rates in high speed IOs have continued to increase. These high data rates require the IO capacitances have to be very low. ESD protection structures have traditionally been large to handle the large transient currents. Recently, the high speed IO has limited the capacitance associated with ESD structures, making ESD protection design for high speed IOs extremely challenging. This paper will discuss the networking industry's trends in high speed IOs, the capacitance requirements and resulting challenges for ESD protection designs. To achieve the proper ESD protection, on chip ESD protection schemes will need to change and/or ESD protection specifications may need to lower targeted protection levels. This is a hotly argued topic in the high speed networking industry, which may change the next-generation ESD protection design dramatically. We will discuss the possible ESD design outcomes due to the high speed IOs scaling trends.
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