{"title":"用于双极模拟asic完全定制设计的自动化CAE工具","authors":"M. Chian, K.S. Eshbaugh, L. Sanders","doi":"10.1109/ASIC.1990.186165","DOIUrl":null,"url":null,"abstract":"CAE tools for use in design of bipolar analog ICS with the analog FASTRACK design system are discussed. Two tools, device design and autogen, automatically design and lay out a full-custom transistor. The statistical analysis and modeling (SAM) tool is used to generate model parameter values for a variety of deterministic and statistical simulation modes. A tool for automated synthesis of IC macromodels (ASIM) is provided to create macro/behavioral models of analog and digital blocks for up to 100 times faster circuit-level simulation.<<ETX>>","PeriodicalId":126693,"journal":{"name":"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Automated CAE tools for full custom design of bipolar analog ASICs\",\"authors\":\"M. Chian, K.S. Eshbaugh, L. Sanders\",\"doi\":\"10.1109/ASIC.1990.186165\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"CAE tools for use in design of bipolar analog ICS with the analog FASTRACK design system are discussed. Two tools, device design and autogen, automatically design and lay out a full-custom transistor. The statistical analysis and modeling (SAM) tool is used to generate model parameter values for a variety of deterministic and statistical simulation modes. A tool for automated synthesis of IC macromodels (ASIM) is provided to create macro/behavioral models of analog and digital blocks for up to 100 times faster circuit-level simulation.<<ETX>>\",\"PeriodicalId\":126693,\"journal\":{\"name\":\"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-09-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASIC.1990.186165\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third Annual IEEE Proceedings on ASIC Seminar and Exhibit","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1990.186165","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automated CAE tools for full custom design of bipolar analog ASICs
CAE tools for use in design of bipolar analog ICS with the analog FASTRACK design system are discussed. Two tools, device design and autogen, automatically design and lay out a full-custom transistor. The statistical analysis and modeling (SAM) tool is used to generate model parameter values for a variety of deterministic and statistical simulation modes. A tool for automated synthesis of IC macromodels (ASIM) is provided to create macro/behavioral models of analog and digital blocks for up to 100 times faster circuit-level simulation.<>
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
