Minimal test set generation for fault diagnosis in R-valued PLAs

For fault diagnosis in R-valued PLAs (R/spl ges/2), we construct a test table with rows of test vectors each giving activated product lines and normal output values of the programmed functions. Test vector generation for constructing the test table is based on product-oriented test generation which was proposed by Min and Fujiwara for binary PLAs. The number of test vectors is exactly k/spl middot/(n/spl middot/R-1) where k is the number of product lines in an R-valued n variable PLA. The procedure to construct the test table is based on a hash method on the generated tests. By combining tests in the table, fault diagnosis of PLA can be performed efficiently.