利用非注入盒上的故障注入

Guillaume Bethouart, Nicolas Debande
{"title":"利用非注入盒上的故障注入","authors":"Guillaume Bethouart, Nicolas Debande","doi":"10.1109/FDTC.2015.20","DOIUrl":null,"url":null,"abstract":"Differential Fault Analysis (DFA) attacks are well known to cryptanalyse embedded cryptographic algorithms. However, efficient countermeasures exist and most devices are now secured against this kind of attacks. In the same way, Safe Error attacks avoid most of DFA countermeasures but they can not break a masked implementation. In this paper, we introduce a new fault attack which takes advantage of both kinds of attack and which is efficient with all countermeasures detecting the fault. We illustrate this attack on the DES Sboxes, even if it applies on all non-injective Sboxes. First, we provide a short reminder of DES, we introduce previous attacks performed on it and we present some existing mechanisms to defend it against these threats. Then, we introduce our attack which consists in injecting faults that nullify after passing in the SBoxes of the first round and allows retrieving the key of a secure DES implementation. We continue by presenting the simulated results of our attack. Finally, we detail the results of our attack realised on a DES implemented on a smart card thus confirming its practical feasibility.","PeriodicalId":444709,"journal":{"name":"2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"To Exploit Fault Injection on Non-injective Sboxes\",\"authors\":\"Guillaume Bethouart, Nicolas Debande\",\"doi\":\"10.1109/FDTC.2015.20\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Differential Fault Analysis (DFA) attacks are well known to cryptanalyse embedded cryptographic algorithms. However, efficient countermeasures exist and most devices are now secured against this kind of attacks. In the same way, Safe Error attacks avoid most of DFA countermeasures but they can not break a masked implementation. In this paper, we introduce a new fault attack which takes advantage of both kinds of attack and which is efficient with all countermeasures detecting the fault. We illustrate this attack on the DES Sboxes, even if it applies on all non-injective Sboxes. First, we provide a short reminder of DES, we introduce previous attacks performed on it and we present some existing mechanisms to defend it against these threats. Then, we introduce our attack which consists in injecting faults that nullify after passing in the SBoxes of the first round and allows retrieving the key of a secure DES implementation. We continue by presenting the simulated results of our attack. Finally, we detail the results of our attack realised on a DES implemented on a smart card thus confirming its practical feasibility.\",\"PeriodicalId\":444709,\"journal\":{\"name\":\"2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FDTC.2015.20\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FDTC.2015.20","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

差分故障分析(DFA)攻击以对嵌入式密码算法进行密码分析而闻名。然而,有效的对策是存在的,大多数设备现在都是针对这种攻击的。以同样的方式,安全错误攻击避免了大多数DFA对策,但它们不能破坏掩码实现。在本文中,我们引入了一种新的故障攻击方法,它综合了这两种攻击方法的优点,并且所有的对抗措施都能有效地检测到故障。我们举例说明了这种对DES sbox的攻击,即使它适用于所有非内射sbox。首先,我们简要介绍一下DES,介绍以前对它进行的攻击,并介绍一些现有的机制来保护它免受这些威胁。然后,我们介绍了我们的攻击,它包括注入错误,这些错误在传入第一轮的sbox后失效,并允许检索安全DES实现的密钥。我们继续展示我们攻击的模拟结果。最后,我们详细介绍了在智能卡上实现的DES上实现的攻击结果,从而证实了其实际可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
To Exploit Fault Injection on Non-injective Sboxes
Differential Fault Analysis (DFA) attacks are well known to cryptanalyse embedded cryptographic algorithms. However, efficient countermeasures exist and most devices are now secured against this kind of attacks. In the same way, Safe Error attacks avoid most of DFA countermeasures but they can not break a masked implementation. In this paper, we introduce a new fault attack which takes advantage of both kinds of attack and which is efficient with all countermeasures detecting the fault. We illustrate this attack on the DES Sboxes, even if it applies on all non-injective Sboxes. First, we provide a short reminder of DES, we introduce previous attacks performed on it and we present some existing mechanisms to defend it against these threats. Then, we introduce our attack which consists in injecting faults that nullify after passing in the SBoxes of the first round and allows retrieving the key of a secure DES implementation. We continue by presenting the simulated results of our attack. Finally, we detail the results of our attack realised on a DES implemented on a smart card thus confirming its practical feasibility.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信