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引用次数: 23
摘要
本文概述了新兴的SOI技术及其在通信集成电路中的应用。Si和SiO2的独特特性,加上SiO2薄膜厚度的广泛可实现范围,允许调整现有器件和设计针对RF,高速电线和光子通信应用的新器件。通过使用高电阻率Si衬底,可以实现Q值高达50的电感器以及大功率射频开关。已经测量了创纪录的485GHz的SOI net fT和430GHz的fMAX,从而能够设计各种高性能电路,包括100GHz CML分频器,> 100GHz lc - vco和16Gb/s 8端口核心背板收发器。最后,由于Si和SiO2之间的折射率差异很大,SOI技术可以有效地设计光子器件和电路。
This paper presents an overview of emerging SOI technologies and their application to communication ICs. The unique properties of Si and SiO2, coupled with the broad range of achievable SiO2 film thicknesses, allow tuning of existing devices and the design of new devices targeting RF, high-speed wire line, and photonic communication applications. By using high-resistivity Si substrates, it becomes possible to realize inductors with Q as high as 50 as well as high-power RF switches. Record SOI NFET fT of 485GHz and fMAX of 430GHz have been measured, enabling the design of a broad range of high performance circuits, including 100GHz CML dividers, >100 GHz LC-VCOs, and 16Gb/s 8-port core back-plane transceivers. Finally, due to the large difference in refractive index between Si and SiO2, SOI technology allows the efficient design of photonic devices and circuits.