交易。Q -单晶圆标识的激光打标- 1亿片晶圆的生产经验

S. Wanka, D. Rychtarik, J. Muller, S. Geißler, P. Kappe, M. Spallek, Uli vom Bauer, C. Ludwig, P. Wawer
{"title":"交易。Q -单晶圆标识的激光打标- 1亿片晶圆的生产经验","authors":"S. Wanka, D. Rychtarik, J. Muller, S. Geißler, P. Kappe, M. Spallek, Uli vom Bauer, C. Ludwig, P. Wawer","doi":"10.1109/PVSC.2011.6186144","DOIUrl":null,"url":null,"abstract":"Single wafer identification is a mandatory element of a modern solar cell production [1]. It accelerates the efficiency roadmap of the solar cell and fosters the cost reduction roadmap of the fabrication. The laser marking concept Tra.Q creates an individual code on each and every wafer. This makes process optimization and quality control easier and faster. The solar cells are 100% traceable along the whole value chain [2–4]. Q-Cells has a broad experience of meanwhile 100 million solar cells, being fabricated in the Thalheim manufacturing line. A large statistical database is available. Typically, the code for the individual tracking is engraved onto the bare wafer before the manufacturing process. The big benefits of the single wafer identification are (a) faster learning in production, (b) steeper ramp curves for the introduction of innovations, (c) improved quality control of materials and of products from the suppliers, (d) enhanced transparency to the customer. The single wafer identification helps to make root cause analysis easier and faster and to nail down the key issues in a particular manufacturing site.","PeriodicalId":373149,"journal":{"name":"2011 37th IEEE Photovoltaic Specialists Conference","volume":"51 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Tra.Q — Laser marking for single wafer identification — Production experience from 100 million wafers\",\"authors\":\"S. Wanka, D. Rychtarik, J. Muller, S. Geißler, P. Kappe, M. Spallek, Uli vom Bauer, C. Ludwig, P. Wawer\",\"doi\":\"10.1109/PVSC.2011.6186144\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single wafer identification is a mandatory element of a modern solar cell production [1]. It accelerates the efficiency roadmap of the solar cell and fosters the cost reduction roadmap of the fabrication. The laser marking concept Tra.Q creates an individual code on each and every wafer. This makes process optimization and quality control easier and faster. The solar cells are 100% traceable along the whole value chain [2–4]. Q-Cells has a broad experience of meanwhile 100 million solar cells, being fabricated in the Thalheim manufacturing line. A large statistical database is available. Typically, the code for the individual tracking is engraved onto the bare wafer before the manufacturing process. The big benefits of the single wafer identification are (a) faster learning in production, (b) steeper ramp curves for the introduction of innovations, (c) improved quality control of materials and of products from the suppliers, (d) enhanced transparency to the customer. The single wafer identification helps to make root cause analysis easier and faster and to nail down the key issues in a particular manufacturing site.\",\"PeriodicalId\":373149,\"journal\":{\"name\":\"2011 37th IEEE Photovoltaic Specialists Conference\",\"volume\":\"51 3\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 37th IEEE Photovoltaic Specialists Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.2011.6186144\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 37th IEEE Photovoltaic Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2011.6186144","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

摘要

单晶圆片识别是现代太阳能电池生产的必备要素。它加速了太阳能电池的效率路线图,促进了制造成本的降低路线图。激光打标概念Tra。Q在每个晶圆上创建一个单独的代码。这使得过程优化和质量控制更容易、更快。太阳能电池在整个价值链上是100%可追溯的[2-4]。Q-Cells拥有丰富的经验,同时在塔尔海姆生产线上制造了1亿块太阳能电池。有一个大型的统计数据库。通常,在制造过程之前,单个跟踪的代码被刻在裸晶圆片上。单晶圆识别的最大好处是(a)在生产中更快地学习,(b)更陡峭的坡道曲线,用于引入创新,(c)改进材料和供应商产品的质量控制,(d)增强对客户的透明度。单个晶圆识别有助于使根本原因分析更容易,更快速,并确定特定制造现场的关键问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Tra.Q — Laser marking for single wafer identification — Production experience from 100 million wafers
Single wafer identification is a mandatory element of a modern solar cell production [1]. It accelerates the efficiency roadmap of the solar cell and fosters the cost reduction roadmap of the fabrication. The laser marking concept Tra.Q creates an individual code on each and every wafer. This makes process optimization and quality control easier and faster. The solar cells are 100% traceable along the whole value chain [2–4]. Q-Cells has a broad experience of meanwhile 100 million solar cells, being fabricated in the Thalheim manufacturing line. A large statistical database is available. Typically, the code for the individual tracking is engraved onto the bare wafer before the manufacturing process. The big benefits of the single wafer identification are (a) faster learning in production, (b) steeper ramp curves for the introduction of innovations, (c) improved quality control of materials and of products from the suppliers, (d) enhanced transparency to the customer. The single wafer identification helps to make root cause analysis easier and faster and to nail down the key issues in a particular manufacturing site.
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