基于逆方法的天线阵列缺陷元件识别

V. Schenone, A. Fedeli, C. Estatico, M. Pastorino, A. Randazzo
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引用次数: 0

摘要

提出了一种天线阵中缺陷元件的识别方法。具体地说,诊断问题被重新定义为一个逆问题的解,其中阵列的激励系数信息是从辐射场的测量开始检索的。在正则化的意义上,利用在勒贝格空间框架中发展起来的反演过程,解决了这样一个逆问题。用实际的平面微带贴片阵列对该方法的有效性进行了数值评价,显示出很好的检测能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Identification of Defective Elements in Antenna Arrays Through an Inverse Approach
An approach for the identification of defective elements in antenna arrays is presented in this paper. Specifically, the diagnostic problem is recast as the solution of an inverse problem, in which information about the excitation coefficients of the array is retrieved starting from measurements of the radiated field. Such an inverse problem is solved, in a regularized sense, using an inversion procedure developed in the framework of Lebesgue spaces. The effectiveness of the method has been numerically evaluated using realistic planar microstrip patch arrays, showing very good detection capabilities.
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