机器学习原理在增材制造中的应用

A. Raza, A. Haider, W. Haider
{"title":"机器学习原理在增材制造中的应用","authors":"A. Raza, A. Haider, W. Haider","doi":"10.1109/EIT51626.2021.9491833","DOIUrl":null,"url":null,"abstract":"In recent years, additive manufacturing (AM) has garnered significant attention all over the world due to the exemplary benefits attained during design to achieving superior part quality. Researchers have also started utilizing machine learning (ML) tools to aid the AM process. Emphasis has been laid on the availability of ample datasets and the ease of their acquisition. The need for establishment of feature libraries has been highlighted. Different ML techniques and associated models such as Support Vector Machine (SVM), k-Nearest Neighbor (k-NN), Decision Trees (DT), Deep Convolution Network (DNN), and Convolutional Neural Network (CNN) are being used by researchers for optimization of parameters, defect detection, creation of online monitoring systems as well as predicting the powder spreading mechanism for AM. In fact, most ML tools are utilized either for classification or regression purposes. This paper focuses on the availability of the resources required to employ ML in AM, the applications of ML in AM, present limitations, and potential opportunities for extended use in future.","PeriodicalId":162816,"journal":{"name":"2021 IEEE International Conference on Electro Information Technology (EIT)","volume":"12 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Consolidated Approach towards Application of Machine Learning Principles in Additive Manufacturing\",\"authors\":\"A. Raza, A. Haider, W. Haider\",\"doi\":\"10.1109/EIT51626.2021.9491833\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In recent years, additive manufacturing (AM) has garnered significant attention all over the world due to the exemplary benefits attained during design to achieving superior part quality. Researchers have also started utilizing machine learning (ML) tools to aid the AM process. Emphasis has been laid on the availability of ample datasets and the ease of their acquisition. The need for establishment of feature libraries has been highlighted. Different ML techniques and associated models such as Support Vector Machine (SVM), k-Nearest Neighbor (k-NN), Decision Trees (DT), Deep Convolution Network (DNN), and Convolutional Neural Network (CNN) are being used by researchers for optimization of parameters, defect detection, creation of online monitoring systems as well as predicting the powder spreading mechanism for AM. In fact, most ML tools are utilized either for classification or regression purposes. This paper focuses on the availability of the resources required to employ ML in AM, the applications of ML in AM, present limitations, and potential opportunities for extended use in future.\",\"PeriodicalId\":162816,\"journal\":{\"name\":\"2021 IEEE International Conference on Electro Information Technology (EIT)\",\"volume\":\"12 3\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Conference on Electro Information Technology (EIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIT51626.2021.9491833\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Conference on Electro Information Technology (EIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIT51626.2021.9491833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

近年来,由于增材制造(AM)在设计过程中获得了卓越的零件质量,因此在世界范围内引起了极大的关注。研究人员也开始利用机器学习(ML)工具来辅助增材制造过程。重点放在提供充足的数据集和易于获取这些数据集上。建立特征库的必要性已经得到强调。不同的机器学习技术和相关模型,如支持向量机(SVM)、k-最近邻(k-NN)、决策树(DT)、深度卷积网络(DNN)和卷积神经网络(CNN),正被研究人员用于优化参数、缺陷检测、创建在线监测系统以及预测AM的粉末扩散机制。事实上,大多数ML工具要么用于分类,要么用于回归。本文的重点是在AM中使用ML所需资源的可用性,ML在AM中的应用,目前的限制以及未来扩展使用的潜在机会。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Consolidated Approach towards Application of Machine Learning Principles in Additive Manufacturing
In recent years, additive manufacturing (AM) has garnered significant attention all over the world due to the exemplary benefits attained during design to achieving superior part quality. Researchers have also started utilizing machine learning (ML) tools to aid the AM process. Emphasis has been laid on the availability of ample datasets and the ease of their acquisition. The need for establishment of feature libraries has been highlighted. Different ML techniques and associated models such as Support Vector Machine (SVM), k-Nearest Neighbor (k-NN), Decision Trees (DT), Deep Convolution Network (DNN), and Convolutional Neural Network (CNN) are being used by researchers for optimization of parameters, defect detection, creation of online monitoring systems as well as predicting the powder spreading mechanism for AM. In fact, most ML tools are utilized either for classification or regression purposes. This paper focuses on the availability of the resources required to employ ML in AM, the applications of ML in AM, present limitations, and potential opportunities for extended use in future.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信