e^+e^−$对撞机的高精度电弱超对称性生产截面

S. Heinemeyer, C. Schappacher
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引用次数: 1

摘要

为了在最小超对称标准模型(MSSM)中寻找电弱(EW)粒子,以及对这些粒子的未来精确分析,必须准确了解它们的产生和衰变特性。我们评估了复参数MSSM (cMSSM)中$e^+e^-$对撞机的带电子、中性子和睡眠产生的截面。评估是基于一个完整的单回路计算所有可能的生产通道,包括软和硬光子辐射。数值分析了截面与相关参数的关系。我们发现对许多生产截面有相当大的贡献。它们大约相当于树级结果的15,%,但在极端情况下可能高达40,%或更高。此外,对于许多生产通道,单回路修正对复杂参数的依赖是不可忽略的。因此,完整的单回路贡献对于未来线性$e^+ $e^ -$对撞机(如ILC或CLIC)的物理分析至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-Precision Electroweak SUSY Production Cross Sections at $e^+e^−$ Colliders
For the search for electroweak (EW) particles in the Minimal Supersymmetric Standard Model (MSSM) as well as for future precision analyses of these particles an accurate knowledge of their production and decay properties is mandatory. We evaluate the cross sections for the chargino, neutralino and slepton production at $e^+e^-$ colliders in the MSSM with complex parameters (cMSSM). The evaluation is based on a full one-loop calculation of all possible production channels including soft and hard photon radiation. The dependence of the cross sections on the relevant cMSSM parameters is analyzed numerically. We find sizable contributions to many production cross sections. They amount to roughly $15\,\%$ of the tree-level results but can go up to $40\,\%$ or higher in extreme cases. Also the dependence on complex parameters of the one-loop corrections for many production channels was found non-negligible. The full one-loop contributions are thus crucial for physics analyses at a future linear $e^+e^-$ collider such as the ILC or CLIC.
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