基于环形振荡器puf的电路认证

Susana Eiroa, I. Baturone
{"title":"基于环形振荡器puf的电路认证","authors":"Susana Eiroa, I. Baturone","doi":"10.1109/ICECS.2011.6122368","DOIUrl":null,"url":null,"abstract":"The use of Ring Oscillator PUFs to provide circuit authentication is analyzed in this paper. The limitations of the previously reported approach in terms of false rejection (due to high intra-die variations) and false acceptance (due to small inter-die variations) are discussed. These limitations are overcome by a new proposal that makes the authentication more robust against noise, temperature and power supply variations, without increasing considerably hardware complexity. All these issues are illustrated with experimental results obtained with FPGAs from Xilinx.","PeriodicalId":251525,"journal":{"name":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Circuit authentication based on Ring-Oscillator PUFs\",\"authors\":\"Susana Eiroa, I. Baturone\",\"doi\":\"10.1109/ICECS.2011.6122368\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The use of Ring Oscillator PUFs to provide circuit authentication is analyzed in this paper. The limitations of the previously reported approach in terms of false rejection (due to high intra-die variations) and false acceptance (due to small inter-die variations) are discussed. These limitations are overcome by a new proposal that makes the authentication more robust against noise, temperature and power supply variations, without increasing considerably hardware complexity. All these issues are illustrated with experimental results obtained with FPGAs from Xilinx.\",\"PeriodicalId\":251525,\"journal\":{\"name\":\"2011 18th IEEE International Conference on Electronics, Circuits, and Systems\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 18th IEEE International Conference on Electronics, Circuits, and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECS.2011.6122368\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2011.6122368","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

本文分析了利用环形振荡器puf提供电路认证的方法。讨论了先前报道的方法在错误拒绝(由于高模内变化)和错误接受(由于小模间变化)方面的局限性。一项新的提议克服了这些限制,该提议使身份验证对噪声、温度和电源变化的抵抗力更强,而不会增加相当大的硬件复杂性。所有这些问题都用赛灵思fpga的实验结果进行了说明。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Circuit authentication based on Ring-Oscillator PUFs
The use of Ring Oscillator PUFs to provide circuit authentication is analyzed in this paper. The limitations of the previously reported approach in terms of false rejection (due to high intra-die variations) and false acceptance (due to small inter-die variations) are discussed. These limitations are overcome by a new proposal that makes the authentication more robust against noise, temperature and power supply variations, without increasing considerably hardware complexity. All these issues are illustrated with experimental results obtained with FPGAs from Xilinx.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信