Al2O3上银厚膜导体焊点长时间稳定性评价

P. Gierth, Michael Zieschank, L. Rebenklau
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引用次数: 0

摘要

研究了银基厚膜膏焊点的长时间稳定性。因此,进行了剪切强度,电阻,电阻温度系数(TCR),焊料表面的光学检查和截面分析。在Ag/Pd或Ag/Pt导体上分别制备了SnAgCu、SnPbAg、SnBi和SnCu封装的1206和0805贴片元件样品。为了检测金属间相生长的影响,根据JESD22-A103C在150°C (snbi焊料为125°C)下进行了长达500 h的高温储存。根据JESD22-A104D在+125°C/-40°C之间进行多达1000次的温度循环,研究了连接接头的剪切疲劳寿命。将评估和讨论剪切疲劳和电气特性的差异。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluation of long time stability of solder joints on Ag thick film conductors on Al2O3
The long time stability of solder joints on Ag-based thick film pastes has been studied. Therefore shear strength, electrical resistance, temperature coefficient of resistance (TCR), optical inspections of solder surface and cross section analyses have been performed. Samples of 1206 and 0805 SMD-components mounted with SnAgCu, SnPbAg, SnBi and SnCu on Ag/Pd or Ag/Pt conductors were prepared. To detect the influence of intermetallic phase growth, high temperature storage according JESD22-A103C at 150°C (125°C for SnBi-solder) up to 500 h has been applied. Shear fatigue life of the interconnection joints was studied with temperature cycling according JESD22-A104D between +125°C/-40°C for up to 1000 cycles. Differences in shear fatigue and electrical characteristics will be evaluated and discussed.
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