{"title":"优化了0.1 μ m GaAs MESFET","authors":"K. Moore, J. East, G. Haddad, T. Brock","doi":"10.1109/MWSYM.1992.188065","DOIUrl":null,"url":null,"abstract":"The authors have optimized the design of conventional GaAs MESFETs for high-frequency operation. FETs were fabricated using electron beam lithography to define 0.1- mu m mushroom and T gates. The best results obtained included peak transconductance of 600 mS/mm, f/sub t/=93 GHz, and f/sub max/>or=150 GHz. In addition, studies were carried out to examine the effect of gate shape and location on high-frequency device performance.<<ETX>>","PeriodicalId":165665,"journal":{"name":"1992 IEEE Microwave Symposium Digest MTT-S","volume":"60 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Optimized 0.1 mu m GaAs MESFET's\",\"authors\":\"K. Moore, J. East, G. Haddad, T. Brock\",\"doi\":\"10.1109/MWSYM.1992.188065\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors have optimized the design of conventional GaAs MESFETs for high-frequency operation. FETs were fabricated using electron beam lithography to define 0.1- mu m mushroom and T gates. The best results obtained included peak transconductance of 600 mS/mm, f/sub t/=93 GHz, and f/sub max/>or=150 GHz. In addition, studies were carried out to examine the effect of gate shape and location on high-frequency device performance.<<ETX>>\",\"PeriodicalId\":165665,\"journal\":{\"name\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"volume\":\"60 6\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1992.188065\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 IEEE Microwave Symposium Digest MTT-S","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1992.188065","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors have optimized the design of conventional GaAs MESFETs for high-frequency operation. FETs were fabricated using electron beam lithography to define 0.1- mu m mushroom and T gates. The best results obtained included peak transconductance of 600 mS/mm, f/sub t/=93 GHz, and f/sub max/>or=150 GHz. In addition, studies were carried out to examine the effect of gate shape and location on high-frequency device performance.<>