用于极端环境应用的CMOS兼容SOI mesfet

J. Vandersand, V. Kushner, J. Yane, B. Blalock, T. Thornton
{"title":"用于极端环境应用的CMOS兼容SOI mesfet","authors":"J. Vandersand, V. Kushner, J. Yane, B. Blalock, T. Thornton","doi":"10.1109/AERO.2005.1559564","DOIUrl":null,"url":null,"abstract":"Silicon-on-insulator MESFETs have been manufactured using a commercial SOI CMOS process and their electrical characteristics measured from room temperature up to 200deg C. No modifications were made to the CMOS process flow. The prototype devices use a CoSi2 gate material and the gate current follows the expected Shottky diode behavior. At room temperature a 0.6 mum gate length device has a threshold voltage of -0.8 V with an off-state drain current of approximately 5 nA. The device shows an attractive family of I-V curves up to 200deg C. For higher temperatures the reverse diode current makes it hard to switch the device off. Numerical simulations of a similar device with a higher barrier height PtSi gate show reasonable behavior up to 300degC","PeriodicalId":117223,"journal":{"name":"2005 IEEE Aerospace Conference","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"CMOS Compatible SOI MESFETs for Extreme Environment Applications\",\"authors\":\"J. Vandersand, V. Kushner, J. Yane, B. Blalock, T. Thornton\",\"doi\":\"10.1109/AERO.2005.1559564\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silicon-on-insulator MESFETs have been manufactured using a commercial SOI CMOS process and their electrical characteristics measured from room temperature up to 200deg C. No modifications were made to the CMOS process flow. The prototype devices use a CoSi2 gate material and the gate current follows the expected Shottky diode behavior. At room temperature a 0.6 mum gate length device has a threshold voltage of -0.8 V with an off-state drain current of approximately 5 nA. The device shows an attractive family of I-V curves up to 200deg C. For higher temperatures the reverse diode current makes it hard to switch the device off. Numerical simulations of a similar device with a higher barrier height PtSi gate show reasonable behavior up to 300degC\",\"PeriodicalId\":117223,\"journal\":{\"name\":\"2005 IEEE Aerospace Conference\",\"volume\":\"70 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-03-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE Aerospace Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AERO.2005.1559564\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE Aerospace Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AERO.2005.1559564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

摘要

绝缘体上硅mesfet已使用商用SOI CMOS工艺制造,其电气特性在室温至200℃范围内测量。原型器件使用CoSi2栅极材料,栅极电流遵循预期的肖特基二极管行为。在室温下,0.6 μ m栅极长度器件的阈值电压为-0.8 V,失态漏极电流约为5na。该器件显示了一个有吸引力的I-V曲线家族,高达200摄氏度。对于较高的温度,反向二极管电流使其难以关闭器件。对具有更高势垒高度的PtSi栅极的类似器件进行了数值模拟,结果表明该器件在高达300℃的温度下具有合理的性能
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CMOS Compatible SOI MESFETs for Extreme Environment Applications
Silicon-on-insulator MESFETs have been manufactured using a commercial SOI CMOS process and their electrical characteristics measured from room temperature up to 200deg C. No modifications were made to the CMOS process flow. The prototype devices use a CoSi2 gate material and the gate current follows the expected Shottky diode behavior. At room temperature a 0.6 mum gate length device has a threshold voltage of -0.8 V with an off-state drain current of approximately 5 nA. The device shows an attractive family of I-V curves up to 200deg C. For higher temperatures the reverse diode current makes it hard to switch the device off. Numerical simulations of a similar device with a higher barrier height PtSi gate show reasonable behavior up to 300degC
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