{"title":"激光可编程逻辑阵列的设计辅助工具和测试结果","authors":"D. L. Allen, Richard Goldenberg","doi":"10.1109/ICCD.1990.130248","DOIUrl":null,"url":null,"abstract":"The time required to customized a logic array circuit can be reduced to minutes by the use of laser programming without the access and resistance limitations of electrically programmable devices. A restructable logic array (RLA) that can be completely tested before packaging and can be fabricated in a standard CMOS process has been developed. Its key element is a connective laser link device. Circuits of up to 1200 gate equivalents have been restructured, and a base array of 4000 raw gate equivalents is in fabrication. A chip architecture, associated testing, and electrical design features, as well as their use in custom circuits are described.<<ETX>>","PeriodicalId":441935,"journal":{"name":"Proceedings., 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors","volume":"24 7","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Design aids and test results for laser-programmable logic arrays\",\"authors\":\"D. L. Allen, Richard Goldenberg\",\"doi\":\"10.1109/ICCD.1990.130248\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The time required to customized a logic array circuit can be reduced to minutes by the use of laser programming without the access and resistance limitations of electrically programmable devices. A restructable logic array (RLA) that can be completely tested before packaging and can be fabricated in a standard CMOS process has been developed. Its key element is a connective laser link device. Circuits of up to 1200 gate equivalents have been restructured, and a base array of 4000 raw gate equivalents is in fabrication. A chip architecture, associated testing, and electrical design features, as well as their use in custom circuits are described.<<ETX>>\",\"PeriodicalId\":441935,\"journal\":{\"name\":\"Proceedings., 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors\",\"volume\":\"24 7\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-09-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.1990.130248\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.1990.130248","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design aids and test results for laser-programmable logic arrays
The time required to customized a logic array circuit can be reduced to minutes by the use of laser programming without the access and resistance limitations of electrically programmable devices. A restructable logic array (RLA) that can be completely tested before packaging and can be fabricated in a standard CMOS process has been developed. Its key element is a connective laser link device. Circuits of up to 1200 gate equivalents have been restructured, and a base array of 4000 raw gate equivalents is in fabrication. A chip architecture, associated testing, and electrical design features, as well as their use in custom circuits are described.<>