Covalent Grafting of Polyoxometalate Hybrids onto Flat Silicon/Silicon Oxide: Insights from POMs Layers on Oxides

Pub Date : 2020-11-17 DOI:10.1021/acsami.0c12300.s001
Maxime Laurans, K. Trinh, K. D. Francesca, G. Izzet, S. Alvès, E. Derat, V. Humblot, O. Pluchery, D. Vuillaume, S. Lenfant, F. Volatron, A. Proust
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Abstract

Immobilization of polyoxometalates (POMs) onto oxides is relevant to many applications in the fields of catalysis, energy conversion/storage or molecular electronics. Optimization and understanding the molecule/oxide interface is crucial to rationally improve the performance of the final molecular materials. We herein describe the synthesis and covalent grafting of POM hybrids with remote carboxylic acid functions onto flat Si/SiO2 substrates. Special attention has been paid to the characterization of the molecular layer and to the description of the POM anchoring mode at the oxide interface through the use of various characterization techniques, including ellipsometry, AFM, XPS and FTIR. Finally, electron transport properties were probed in a vertical junction configuration and energy level diagrams have been drawn and discussed in relation with the POM molecular electronic features inferred from cyclic-voltammetry, UVvisible absorption spectra and theoretical calculations. The electronic properties of these POMbased molecular junctions are driven by the POM LUMO (d-orbitals) whatever the nature of the tether or the anchoring group.
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多金属氧酸盐杂化物在平面硅/氧化硅上的共价接枝:来自氧化物上pom层的见解
多金属氧酸盐(pom)在氧化物上的固定化在催化、能量转换/存储或分子电子学等领域有着广泛的应用。优化和理解分子/氧化物界面对于合理提高最终分子材料的性能至关重要。本文描述了具有远羧酸功能的POM杂化物在平面Si/SiO2衬底上的合成和共价接枝。通过使用各种表征技术,包括椭偏、原子力显微镜、XPS和FTIR,特别关注了分子层的表征和氧化界面上POM锚定模式的描述。最后,研究了垂直结结构下的电子输运性质,并根据循环伏安法、紫外可见吸收光谱和理论计算得出的POM分子电子特征,绘制并讨论了能级图。无论系绳或锚定基团的性质如何,这些基于POM的分子结的电子特性都是由POM LUMO (d轨道)驱动的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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