{"title":"Atomic depth distribution analysis of Ag and Au on Si(111) during epitaxial growth by total reflection angle X-ray spectroscopy","authors":"Toshiro Yamanaka, Akira Endo, Shozo Ino","doi":"10.1016/0167-2584(93)91125-8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":101188,"journal":{"name":"Surface Science Letters","volume":"294 1","pages":"Page A659"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0167-2584(93)91125-8","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface Science Letters","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0167258493911258","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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