{"title":"Atomic resolution in noncontact AFM by probing cantilever frequency shifts","authors":"Hong Yong Xie","doi":"10.1016/j.cpart.2006.09.001","DOIUrl":null,"url":null,"abstract":"<div><p>Rutile TiO<sub>2</sub> (0<!--> <!-->0<!--> <!-->1) quantum dots (or nano-marks) in different shapes were used to imitate uncleaved material surfaces or materials with rough surfaces. By numerical integration of the equation of motion of cantilever for silicon tip scanning along the [1<!--> <!-->1<!--> <!-->0] direction over the rutile TiO<sub>2</sub> (0<!--> <!-->0<!--> <!-->1) quantum dots in ultra high vacuum (UHV), scanning routes were explored to achieve atomic resolution from frequency shift image. The tip–surface interaction forces were calculated from Lennard–Jones (12-6) potential by the Hamaker summation method. The calculated results showed that atomic resolution could be achieved by frequency shift image for TiO<sub>2</sub> (0<!--> <!-->0<!--> <!-->1) surfaces of rhombohedral quantum dot scanning in a vertical route, and spherical cap quantum dot scanning in a superposition route.</p></div>","PeriodicalId":100239,"journal":{"name":"China Particuology","volume":"5 3","pages":"Pages 242-246"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/j.cpart.2006.09.001","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"China Particuology","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1672251507000498","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Rutile TiO2 (0 0 1) quantum dots (or nano-marks) in different shapes were used to imitate uncleaved material surfaces or materials with rough surfaces. By numerical integration of the equation of motion of cantilever for silicon tip scanning along the [1 1 0] direction over the rutile TiO2 (0 0 1) quantum dots in ultra high vacuum (UHV), scanning routes were explored to achieve atomic resolution from frequency shift image. The tip–surface interaction forces were calculated from Lennard–Jones (12-6) potential by the Hamaker summation method. The calculated results showed that atomic resolution could be achieved by frequency shift image for TiO2 (0 0 1) surfaces of rhombohedral quantum dot scanning in a vertical route, and spherical cap quantum dot scanning in a superposition route.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
