{"title":"Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method","authors":"Chung-Huang Yeh, Jwu-E Chen","doi":"10.1142/s021812662350202x","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":14696,"journal":{"name":"J. Circuits Syst. Comput.","volume":"63 ","pages":"2350202:1-2350202:20"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"J. Circuits Syst. Comput.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/s021812662350202x","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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