B. Hoang, F. Wong, V. Funderburk, M. Cho, K. Toyoda, H. Masui
{"title":"Electrostatic discharge test with simulated coverglass flashover for multi-junction GaAs/Ge solar array design","authors":"B. Hoang, F. Wong, V. Funderburk, M. Cho, K. Toyoda, H. Masui","doi":"10.1109/PVSC.2010.5614721","DOIUrl":null,"url":null,"abstract":"Space Systems/Loral (SS/L) successfully completed electrostatic discharge (ESD) tests of Multi-junction (MJ) GaAs/Ge solar array design in geosynchronous space environment. This ESD test was based on ISO-11221, Space systems - Space solar panels -Spacecraft Charging Induced Electrostatic Discharge Test Methods. In addition to the ISO reference for the test schematic, SS/L implemented modified test circuitry to better simulate the on-orbit operational conditions of our solar array design. The ESD test circuit also included simulated solar array panel coverglass flashover. The ESD test program utilized a 25-cell coupon that had been subjected to 2,000 thermal cycles caused by earth eclipses in GEO orbit and >12,000 thermal cycles caused by the shadow of the spacecraft antennas. Other ESD test coupons are 4-cell coupons that, after baseline ESD experiments, can later be subjected to combined space environmental exposures tests. To demonstrate design robustness, we performed ESD tests to voltages and currents that are higher than that of on-orbit solar array operational voltages and currents. This paper discusses the coverglass flashover simulation, ESD test setup, the importance of the electrical test design in simulating the on-orbit operational conditions, and the test results.","PeriodicalId":6424,"journal":{"name":"2010 35th IEEE Photovoltaic Specialists Conference","volume":"46 1","pages":"001118-001123"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 35th IEEE Photovoltaic Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2010.5614721","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
Space Systems/Loral (SS/L) successfully completed electrostatic discharge (ESD) tests of Multi-junction (MJ) GaAs/Ge solar array design in geosynchronous space environment. This ESD test was based on ISO-11221, Space systems - Space solar panels -Spacecraft Charging Induced Electrostatic Discharge Test Methods. In addition to the ISO reference for the test schematic, SS/L implemented modified test circuitry to better simulate the on-orbit operational conditions of our solar array design. The ESD test circuit also included simulated solar array panel coverglass flashover. The ESD test program utilized a 25-cell coupon that had been subjected to 2,000 thermal cycles caused by earth eclipses in GEO orbit and >12,000 thermal cycles caused by the shadow of the spacecraft antennas. Other ESD test coupons are 4-cell coupons that, after baseline ESD experiments, can later be subjected to combined space environmental exposures tests. To demonstrate design robustness, we performed ESD tests to voltages and currents that are higher than that of on-orbit solar array operational voltages and currents. This paper discusses the coverglass flashover simulation, ESD test setup, the importance of the electrical test design in simulating the on-orbit operational conditions, and the test results.
Space Systems/Loral (SS/L)公司成功完成了地球同步空间环境下多结(MJ) GaAs/Ge太阳能电池阵列设计的静电放电(ESD)测试。该ESD测试基于ISO-11221《空间系统-空间太阳能电池板-航天器充电感应静电放电测试方法》。除了测试原理图的ISO参考外,SS/L还实施了修改的测试电路,以更好地模拟我们的太阳能电池阵列设计的在轨运行条件。ESD测试电路还包括模拟太阳能电池板覆盖玻璃闪络。ESD测试程序使用了25个单元的优惠券,该优惠券已经经历了由地球在GEO轨道上的日食引起的2000次热循环和由航天器天线阴影引起的12000次热循环。其他静电放电试验片为4单元片,在基线静电放电实验后,可随后进行联合空间环境暴露试验。为了证明设计的稳健性,我们对高于在轨太阳能电池阵列工作电压和电流的电压和电流进行了ESD测试。本文讨论了盖板闪络仿真、ESD试验设置、电气试验设计在模拟在轨运行条件中的重要性以及试验结果。