A 3.14 um2 4T-2MTJ-cell fully parallel TCAM based on nonvolatile logic-in-memory architecture

S. Matsunaga, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu
{"title":"A 3.14 um2 4T-2MTJ-cell fully parallel TCAM based on nonvolatile logic-in-memory architecture","authors":"S. Matsunaga, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu","doi":"10.1109/VLSIC.2012.6243781","DOIUrl":null,"url":null,"abstract":"A four-MOS-transistor/two-MTJ-device (4T-2MTJ) cell circuit is proposed and fabricated for a standby-power-free and a high-density fully parallel nonvolatile TCAM. By optimally merging a nonvolatile storage function and a comparison logic function into a TCAM cell circuit with a nonvolatile logic-in-memory structure, the transistor counts required in the cell circuit become minimized. As a result, the cell size becomes 3.14um2 under a 90-nm CMOS and a 100-nm MTJ technologies, which achieves 60% and 86% of area reduction in comparison with that of a 12T-SRAM-based and a 16T-SRAM-based TCAM cell circuit, respectively.","PeriodicalId":6347,"journal":{"name":"2012 Symposium on VLSI Circuits (VLSIC)","volume":"60 1","pages":"44-45"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"83","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Symposium on VLSI Circuits (VLSIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2012.6243781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 83

Abstract

A four-MOS-transistor/two-MTJ-device (4T-2MTJ) cell circuit is proposed and fabricated for a standby-power-free and a high-density fully parallel nonvolatile TCAM. By optimally merging a nonvolatile storage function and a comparison logic function into a TCAM cell circuit with a nonvolatile logic-in-memory structure, the transistor counts required in the cell circuit become minimized. As a result, the cell size becomes 3.14um2 under a 90-nm CMOS and a 100-nm MTJ technologies, which achieves 60% and 86% of area reduction in comparison with that of a 12T-SRAM-based and a 16T-SRAM-based TCAM cell circuit, respectively.
基于非易失性内存逻辑架构的3.14 um2 4t - 2mtj单元全并行TCAM
提出并制作了一种4 mos晶体管/ 2 mtj器件(4T-2MTJ)单元电路,用于无备用电源和高密度全并联非易失性TCAM。通过将非易失性存储功能和比较逻辑功能以最佳方式合并到具有非易失性逻辑存储器结构的TCAM单元电路中,使单元电路所需的晶体管计数最小化。因此,在90 nm CMOS和100 nm MTJ技术下,单元尺寸为3.14um2,与基于12t - sram和基于16t - sram的TCAM单元电路相比,面积分别减少了60%和86%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信