Излучательная рекомбинация в разъединенном гетеропереходе II типа InAs/InSb с квантовыми точками на интерфейсе

Я.А. Пархоменко, Э.В. Иванов, К.Д. Моисеев
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Abstract

The electroluminescent properties of narrow-gap type II InAs/InSb/InAs heterostructures containing a single layer of InSb quantum dots placed at the interface of the p-n junction in InAs were studied. The features of the electroluminescence spectra depending on the surface density of nanoobjects at a broken-gap type II heterointerface were investigated both at forward and reverse bias. When applying a reverse bias to the heterostructures under study, the suppression of negative interband luminescence and the dominance of interface recombination transitions at the InSb/InAs type II heterojunction were observed at room temperature. The radiation, which corresponded to recombination transitions involving localized states of InSb quantum dots, was recorded at low temperature.
InAs/InSb分离的InAs/InSb异质转换器辐射复合,界面上有量子点。
研究了在InAs的p-n结界面上放置单层InSb量子点的窄间隙II型InAs/InSb/InAs异质结构的电致发光性能。研究了在正偏压和反向偏压下,纳米物体在II型断隙异质界面上的电致发光光谱随表面密度的变化特征。当对所研究的异质结构施加反向偏压时,在室温下观察到InSb/InAs II型异质结的负带间发光被抑制,界面复合跃迁占主导地位。该辐射对应于InSb量子点局域态的重组跃迁,在低温下被记录下来。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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