Charge state fractions of sputtered Ni

H.-J. Barth, E. Mühling, W. Eckstein
{"title":"Charge state fractions of sputtered Ni","authors":"H.-J. Barth,&nbsp;E. Mühling,&nbsp;W. Eckstein","doi":"10.1016/0378-5963(85)90045-5","DOIUrl":null,"url":null,"abstract":"<div><p>Energy distributions of sputtered Ni ions and neutrals were measured at non-normal incidence of Ne and Ar ions. Only the Ni particles sputtered in a binary collision can be used for the determination of the charge state fractions. Monte Carlo simulations (TRIM SP) were used for the absolute calibration of the total intensity in the binary recoil peak. The charged fractions are found to be less than 10% for energies below 5 keV. The positive fraction is about one order of magnitude larger than the negative and the doubly charged fractions.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 136-144"},"PeriodicalIF":0.0000,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90045-5","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applications of Surface Science","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0378596385900455","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Energy distributions of sputtered Ni ions and neutrals were measured at non-normal incidence of Ne and Ar ions. Only the Ni particles sputtered in a binary collision can be used for the determination of the charge state fractions. Monte Carlo simulations (TRIM SP) were used for the absolute calibration of the total intensity in the binary recoil peak. The charged fractions are found to be less than 10% for energies below 5 keV. The positive fraction is about one order of magnitude larger than the negative and the doubly charged fractions.

溅射镍的电荷态分数
在非正态入射下,测量了溅射Ni离子和中性离子的能量分布。只有在二元碰撞中溅射的Ni粒子才能用于电荷态分数的测定。采用蒙特卡罗模拟(TRIM SP)对双后坐力峰的总强度进行了绝对标定。发现能量低于5kev的带电分数小于10%。正电荷部分大约比负电荷部分和双电荷部分大一个数量级。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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