Диагностика технологии оксидов титана и гафния методами люминесценции

С. В. Булярский, Г.Г. Гусаров, А. А. Дудин, Д.А. Коива, К.И. Литвинова
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Abstract

The article shows the role of oxygen vacancies in the formation of luminescence bands of titanium and hafnium oxides, and also demonstrates the relationship between the intensity of luminescence bands and the conditions for the synthesis of films of these materials. It is concluded that photoluminescence is a very sensitive method for diagnosing the composition of oxides. Luminescence bands at 2.45 eV in titanium oxide and 2.91 eV in hafnium oxide make it possible to analyze the change in the film composition under various technological conditions of their production.
本文论述了氧空位在氧化钛和氧化铪的发光带形成中的作用,并论证了这些材料的发光带强度与薄膜合成条件之间的关系。结果表明,光致发光是一种非常灵敏的诊断氧化物组成的方法。氧化钛和氧化铪在2.45 eV和2.91 eV的发光带使得分析不同生产工艺条件下膜成分的变化成为可能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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