Evaluation and comparison of silicon and gallium nitride power transistors in LLC resonant converter

Weimin Zhang, Yu Long, Zheyu Zhang, F. Wang, L. Tolbert, B. Blalock, S. Henning, C. Wilson, R. Dean
{"title":"Evaluation and comparison of silicon and gallium nitride power transistors in LLC resonant converter","authors":"Weimin Zhang, Yu Long, Zheyu Zhang, F. Wang, L. Tolbert, B. Blalock, S. Henning, C. Wilson, R. Dean","doi":"10.1109/ECCE.2012.6342657","DOIUrl":null,"url":null,"abstract":"Silicon Power MOSFETs, with more than thirty years of development, are widely accepted and applied in power converters. Gallium Nitride (GaN) power devices are commercially available in recent years [1], but the device performance and application have not been fully developed. In this paper, GaN devices are compared with state-of-art Si devices to evaluate the device impact on soft-switching DC-DC converters, like LLC resonant converter. The analytical approach of device selection and comparison are conducted and loss related device parameters are derived. Total device losses are compared between Si and GaN based on these parameters. GaN shows less loss compared with Si, yielding approximately a 20% reduction of total device loss. Two 300 W, 500 kHz, 48 V-12 V GaN-based and Si-based converter prototypes are built and tested. Since the body diode forward voltage drop of GaN device is high, the dead time is adjusted to minimize the body diode conduction period. The peak efficiency of the GaN-based converter is 97.5%, and the full load efficiency is 96.1%, which is around 0.3% higher than the Si-based converter at full load. The test results shows that, although GaN device has lower loss, the improvement of converter efficiency is not much. The reason is that the transformer loss accounts for more than 60% of total loss. Therefore, a transformer which fits the GaN device characteristic need to be further investigated.","PeriodicalId":6401,"journal":{"name":"2012 IEEE Energy Conversion Congress and Exposition (ECCE)","volume":"62 1","pages":"1362-1366"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"74","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE Energy Conversion Congress and Exposition (ECCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCE.2012.6342657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 74

Abstract

Silicon Power MOSFETs, with more than thirty years of development, are widely accepted and applied in power converters. Gallium Nitride (GaN) power devices are commercially available in recent years [1], but the device performance and application have not been fully developed. In this paper, GaN devices are compared with state-of-art Si devices to evaluate the device impact on soft-switching DC-DC converters, like LLC resonant converter. The analytical approach of device selection and comparison are conducted and loss related device parameters are derived. Total device losses are compared between Si and GaN based on these parameters. GaN shows less loss compared with Si, yielding approximately a 20% reduction of total device loss. Two 300 W, 500 kHz, 48 V-12 V GaN-based and Si-based converter prototypes are built and tested. Since the body diode forward voltage drop of GaN device is high, the dead time is adjusted to minimize the body diode conduction period. The peak efficiency of the GaN-based converter is 97.5%, and the full load efficiency is 96.1%, which is around 0.3% higher than the Si-based converter at full load. The test results shows that, although GaN device has lower loss, the improvement of converter efficiency is not much. The reason is that the transformer loss accounts for more than 60% of total loss. Therefore, a transformer which fits the GaN device characteristic need to be further investigated.
LLC谐振变换器中硅与氮化镓功率晶体管的评价与比较
经过三十多年的发展,硅功率mosfet在功率变换器中得到了广泛的认可和应用。近年来,氮化镓(GaN)功率器件已商品化,但其性能和应用尚未得到充分发展。本文将GaN器件与最先进的Si器件进行比较,以评估器件对软开关DC-DC变换器(如LLC谐振变换器)的影响。提出了器件选择和比较的分析方法,并推导了与损耗相关的器件参数。基于这些参数比较了Si和GaN之间的总器件损耗。与硅相比,氮化镓显示出更少的损耗,产生的总器件损耗减少了大约20%。构建并测试了两个300 W, 500 kHz, 48 V-12 V的gan和si转换器原型。由于GaN器件的主体二极管正向压降较高,因此可调整死区时间以最小化主体二极管导通时间。gan基变换器的峰值效率为97.5%,满载效率为96.1%,比si基变换器的峰值效率高0.3%左右。测试结果表明,虽然GaN器件具有较低的损耗,但变换器效率的提高并不大。原因是变压器损耗占总损耗的60%以上。因此,适合GaN器件特性的变压器需要进一步研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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