{"title":"Ordered shapes of the CVD SiO2 evinced by wet etching","authors":"A. Baracu, R. Pascu, F. Craciunoiu","doi":"10.1109/SMICND.2014.6966410","DOIUrl":null,"url":null,"abstract":"As we know, both grown and deposited SiO<sub>2</sub> is considered an amorphous material. A lot of experiments based on the silicon dioxide etching showed a series of micro and nano-formations which lead to a polycrystalline structure assumption. This paper is focused on the “crystalline” form of the SiO<sub>2</sub> after a wet etching in NH<sub>4</sub>F:CH<sub>3</sub>COOH solution. In order to modify the selectivity of the mixture, we have tested 3 different concentrations. There were performed a lot of investigations using SEM, AFM and Optical microscopy.","PeriodicalId":6616,"journal":{"name":"2014 International Semiconductor Conference (CAS)","volume":"11 1","pages":"121-124"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2014.6966410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
As we know, both grown and deposited SiO2 is considered an amorphous material. A lot of experiments based on the silicon dioxide etching showed a series of micro and nano-formations which lead to a polycrystalline structure assumption. This paper is focused on the “crystalline” form of the SiO2 after a wet etching in NH4F:CH3COOH solution. In order to modify the selectivity of the mixture, we have tested 3 different concentrations. There were performed a lot of investigations using SEM, AFM and Optical microscopy.