Design of IGBT Parameter Automatic Test System Based on LabVIEW

Abstract

Aiming at the problems of static parameters and dynamic parameter testing of IGBT (Insulated Gate Bipolar Transistor), the error is large, the efficiency is low, and the test structure is poorly mixed. This paper proposes to use LabVIEWbased test system to measure the parameters. Using NI ELVIS as the measuring instrument platform, the ADC0809 single-chip microcomputer and the hardware circuit corresponding to the series voltage equalization are used as the execution process of the measurement process, making the measurement data more precise and stable. The stability and function of the IGBT are evaluated by measuring the saturation voltage drop, the off current and the switching off time as the measurement parameters.