{"title":"i-MSE : A Fine Structure Imaging for Surface and Its Inside of Solid Material with Micro Slurry-jet Erosion Test","authors":"S. Fukuma, Y. Iwai, S. Mori","doi":"10.1587/transfun.2023smp0005","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":48822,"journal":{"name":"Ieice Transactions on Fundamentals of Electronics Communications and Computer Sciences","volume":"21 1","pages":"1376-1384"},"PeriodicalIF":0.5000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ieice Transactions on Fundamentals of Electronics Communications and Computer Sciences","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1587/transfun.2023smp0005","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Computer Science","Score":null,"Total":0}