{"title":"Fault condition detection for a copper flotation process based on a wavelet multi-scale binary froth image","authors":"Lu Ming, Gui Wei-hua, P. Tao, Cao Wei","doi":"10.1590/0370-44672015680195","DOIUrl":null,"url":null,"abstract":"Considering the difficulty of detecting the fault condition of copper flotation in real-time, a new fault condition detection method based on the wavelet multi-scale binary image is proposed. Firstly, the froth gray image is decomposed into approximation sub-images and detailed sub-images by wavelet transformation, whereby the approximation sub-images of different scales are restructured and binarized. Then a new feature that is directly related to froth morphology, namely the equivalent size feature, is obtained by calculating the white area of each binary image according to the space-frequency relationship of a two-dimensional wavelet transformation. After this, the equivalent size distribution of the froth image can be obtained through the equivalent size feature. At last, the equivalent size distributions of different froth images are compared in order to classify the froth images under different flotation conditions. Experiment results, together with the industrial field data, show that this method can simply and effectively detect fault conditions in the copper flotation process.","PeriodicalId":54498,"journal":{"name":"Rem-Revista Escola De Minas","volume":"54 1","pages":"177-185"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Rem-Revista Escola De Minas","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1590/0370-44672015680195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Earth and Planetary Sciences","Score":null,"Total":0}
引用次数: 5
Abstract
Considering the difficulty of detecting the fault condition of copper flotation in real-time, a new fault condition detection method based on the wavelet multi-scale binary image is proposed. Firstly, the froth gray image is decomposed into approximation sub-images and detailed sub-images by wavelet transformation, whereby the approximation sub-images of different scales are restructured and binarized. Then a new feature that is directly related to froth morphology, namely the equivalent size feature, is obtained by calculating the white area of each binary image according to the space-frequency relationship of a two-dimensional wavelet transformation. After this, the equivalent size distribution of the froth image can be obtained through the equivalent size feature. At last, the equivalent size distributions of different froth images are compared in order to classify the froth images under different flotation conditions. Experiment results, together with the industrial field data, show that this method can simply and effectively detect fault conditions in the copper flotation process.
期刊介绍:
REM – International Engineering Journal (antigua REM – Revista Escola de Minas) es la primera revista técnica de Sudamérica. Fue fundada en enero de 1936 por los estudiantes de la Escuela de Minas de Ouro Preto y desde entonces se ha especializado en la publicación de artículos en las áreas de la Ingeniería Civil, Geología, Metalurgia y Materiales y, Minería y Mecánica y Energía.
Su objetivo es servir como un medio de publicación para los trabajos técnicos y científicos originales de investigadores nacionales y extranjeros en esas áreas. Contribuciones originales (artículos y cartas) son aceptadas. Artículos de revisión dependen de la invitación y/o análisis de los Editores.
El envío de artículos para su publicación implica que el trabajo no ha sido publicado previamente, que no está siendo presentado para su publicación en otra revista y no se publicará en otro lugar, en la misma forma, sin el permiso, por escrito, de los Editores/Autores.