HAR, TAAM and BODD refinements of model crystal structures using Cu Kα and Mo Kα X-ray diffraction data

Monika Wanat, M. Malińska, M. Gutmann, R. Cooper, K. Woźniak
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引用次数: 4

Abstract

The Independent Atom Model (IAM) of electron density is used in routine X-ray data analysis. However, this model does not give a quantitative description of the electron-density distribution. A better model that allows for modelling of aspherical charge density deformations is introduced by the Hansen–Coppens variant of the multipole model of electron density. However, the application of this model requires crystals of excellent quality and high-resolution XRD data which are quite often difficult criteria to fulfil. Therefore, Mo Kα and Cu Kα data of three model compounds (tricyclic imide, xylitol and methyluracil) were refined using IAM and new methods which enabled the refinement and reconstruction of charge density based on the Cu Kα data. These methods were the Bond-Oriented Deformation Density (BODD) model, Hirshfeld Atom Refinement (HAR) and the Transferable Aspherical Atom Model (TAAM). The final results were compared to the model obtained from neutron diffraction experiments. Our results demonstrated not only that Cu Kα data may be refined using BODD, HAR and TAAM methods, but also revealed systematic errors arising from the use of Cu Kα data. These errors were a result of the limited information in the low-resolution data set that manifested as higher values for the anisotropic displacement parameters (ADPs) and smaller maxima and minima of the residual electron density for the Cu Kα data compared to the Mo Kα data. Notably, these systematic errors were much less significant than those found for the IAM. Therefore, the application of BODD, HAR and TAAM on Cu Kα data has a more significant influence on the final results of refinement than for the Mo Kα data.
利用Cu Kα和Mo Kα x射线衍射数据对模型晶体结构进行HAR, TAAM和BODD改进
电子密度的独立原子模型(IAM)用于常规的x射线数据分析。然而,该模型并没有给出电子密度分布的定量描述。一个更好的模型,允许模拟非球面电荷密度变形是由电子密度的多极模型的Hansen-Coppens变体。然而,该模型的应用需要高质量的晶体和高分辨率的XRD数据,这通常是难以满足的标准。因此,我们利用IAM和新方法对三种模型化合物(三环亚胺、木糖醇和甲基尿嘧啶)的Mo Kα和Cu Kα数据进行了细化,并基于Cu Kα数据对电荷密度进行了细化和重构。这些方法分别是键取向变形密度(BODD)模型、Hirshfeld原子细化(HAR)模型和可转移非球面原子模型(TAAM)。最后的结果与中子衍射实验得到的模型进行了比较。我们的研究结果不仅证明了Cu Kα数据可以用BODD、HAR和TAAM方法进行细化,而且揭示了使用Cu Kα数据引起的系统误差。这些误差是由于低分辨率数据集中的信息有限,表现为Cu Kα数据的各向异性位移参数(ADPs)值较高,而剩余电子密度的最大值和最小值小于Mo Kα数据。值得注意的是,这些系统性错误远没有IAM发现的那么严重。因此,BODD、HAR和TAAM在Cu Kα数据上的应用比在Mo Kα数据上的应用对最终精化结果的影响更显著。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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