{"title":"Proceedings International Symposium on Quality Electronic Design","authors":"","doi":"10.1109/ISQED.2002.996564","DOIUrl":null,"url":null,"abstract":"The following topics are dealt with: interconnect extraction and modeling; design for process variations; design issues for power and noise management; low power design techniques; quality and interoperability of EDA tools; power, signal and EMI analysis and optimization; verification in achieving design quality; advanced device technology issues in circuit design; design for test; methods and metrics for design quality; signal integrity; design, planning and closure.","PeriodicalId":20510,"journal":{"name":"Proceedings International Symposium on Quality Electronic Design","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Symposium on Quality Electronic Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2002.996564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
The following topics are dealt with: interconnect extraction and modeling; design for process variations; design issues for power and noise management; low power design techniques; quality and interoperability of EDA tools; power, signal and EMI analysis and optimization; verification in achieving design quality; advanced device technology issues in circuit design; design for test; methods and metrics for design quality; signal integrity; design, planning and closure.