{"title":"VRL-DRAM: Improving DRAM Performance via Variable Refresh Latency","authors":"Anup Das, Hasan Hassan, O. Mutlu","doi":"10.1145/3195970.3196136","DOIUrl":null,"url":null,"abstract":"A DRAM chip requires periodic refresh operations to prevent data loss due to charge leakage in DRAM cells. Refresh operations incur significant performance overhead as a DRAM bank/rank becomes unavailable to service access requests while being refreshed. In this work, our goal is to reduce the performance overhead of DRAM refresh by reducing the latency of a refresh operation. We observe that a significant number of DRAM cells can retain their data for longer than the worst-case refresh period of 64ms. Such cells do not always need to be fully refreshed; a low-latency partial refresh is sufficient for them.We propose Variable Refresh Latency DRAM (VRL-DRAM), a mechanism that fully refreshes a DRAM cell only when necessary, and otherwise ensures data integrity by issuing low-latency partial refresh operations. We develop a new detailed analytical model to estimate the minimum latency of a refresh operation that ensures data integrity of a cell with a given retention time profile. We evaluate VRL-DRAM with memory traces from real workloads, and show that it reduces the average refresh performance overhead by 34% compared to the state-of-the-art approach.","PeriodicalId":6491,"journal":{"name":"2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)","volume":"37 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3195970.3196136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 37
Abstract
A DRAM chip requires periodic refresh operations to prevent data loss due to charge leakage in DRAM cells. Refresh operations incur significant performance overhead as a DRAM bank/rank becomes unavailable to service access requests while being refreshed. In this work, our goal is to reduce the performance overhead of DRAM refresh by reducing the latency of a refresh operation. We observe that a significant number of DRAM cells can retain their data for longer than the worst-case refresh period of 64ms. Such cells do not always need to be fully refreshed; a low-latency partial refresh is sufficient for them.We propose Variable Refresh Latency DRAM (VRL-DRAM), a mechanism that fully refreshes a DRAM cell only when necessary, and otherwise ensures data integrity by issuing low-latency partial refresh operations. We develop a new detailed analytical model to estimate the minimum latency of a refresh operation that ensures data integrity of a cell with a given retention time profile. We evaluate VRL-DRAM with memory traces from real workloads, and show that it reduces the average refresh performance overhead by 34% compared to the state-of-the-art approach.