VRL-DRAM: Improving DRAM Performance via Variable Refresh Latency

Anup Das, Hasan Hassan, O. Mutlu
{"title":"VRL-DRAM: Improving DRAM Performance via Variable Refresh Latency","authors":"Anup Das, Hasan Hassan, O. Mutlu","doi":"10.1145/3195970.3196136","DOIUrl":null,"url":null,"abstract":"A DRAM chip requires periodic refresh operations to prevent data loss due to charge leakage in DRAM cells. Refresh operations incur significant performance overhead as a DRAM bank/rank becomes unavailable to service access requests while being refreshed. In this work, our goal is to reduce the performance overhead of DRAM refresh by reducing the latency of a refresh operation. We observe that a significant number of DRAM cells can retain their data for longer than the worst-case refresh period of 64ms. Such cells do not always need to be fully refreshed; a low-latency partial refresh is sufficient for them.We propose Variable Refresh Latency DRAM (VRL-DRAM), a mechanism that fully refreshes a DRAM cell only when necessary, and otherwise ensures data integrity by issuing low-latency partial refresh operations. We develop a new detailed analytical model to estimate the minimum latency of a refresh operation that ensures data integrity of a cell with a given retention time profile. We evaluate VRL-DRAM with memory traces from real workloads, and show that it reduces the average refresh performance overhead by 34% compared to the state-of-the-art approach.","PeriodicalId":6491,"journal":{"name":"2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)","volume":"37 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3195970.3196136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 37

Abstract

A DRAM chip requires periodic refresh operations to prevent data loss due to charge leakage in DRAM cells. Refresh operations incur significant performance overhead as a DRAM bank/rank becomes unavailable to service access requests while being refreshed. In this work, our goal is to reduce the performance overhead of DRAM refresh by reducing the latency of a refresh operation. We observe that a significant number of DRAM cells can retain their data for longer than the worst-case refresh period of 64ms. Such cells do not always need to be fully refreshed; a low-latency partial refresh is sufficient for them.We propose Variable Refresh Latency DRAM (VRL-DRAM), a mechanism that fully refreshes a DRAM cell only when necessary, and otherwise ensures data integrity by issuing low-latency partial refresh operations. We develop a new detailed analytical model to estimate the minimum latency of a refresh operation that ensures data integrity of a cell with a given retention time profile. We evaluate VRL-DRAM with memory traces from real workloads, and show that it reduces the average refresh performance overhead by 34% compared to the state-of-the-art approach.
VRL-DRAM:通过可变刷新延迟提高DRAM性能
DRAM芯片需要定期刷新操作,以防止由于DRAM单元中的电荷泄漏而导致数据丢失。刷新操作会导致显著的性能开销,因为在刷新时,DRAM组/rank对业务访问请求不可用。在这项工作中,我们的目标是通过减少刷新操作的延迟来减少DRAM刷新的性能开销。我们观察到,相当数量的DRAM单元可以保留其数据的时间长于最坏情况下64ms的刷新周期。这些细胞并不总是需要完全更新;对它们来说,低延迟的部分刷新就足够了。我们提出可变刷新延迟DRAM (VRL-DRAM),这是一种仅在必要时完全刷新DRAM单元的机制,否则通过发出低延迟部分刷新操作来确保数据完整性。我们开发了一个新的详细分析模型来估计刷新操作的最小延迟,以确保具有给定保留时间配置文件的单元的数据完整性。我们使用来自实际工作负载的内存跟踪来评估VRL-DRAM,并表明与最先进的方法相比,它将平均刷新性能开销降低了34%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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