{"title":"Scanning photocurrent microscopy in semiconducting carbon nanotube transistors","authors":"Y. Ahn, Jiwoong Park","doi":"10.1109/QELS.2007.4431777","DOIUrl":null,"url":null,"abstract":"Scanning photocurrent measurements are demonstrated in individual carbon nanotube field effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.","PeriodicalId":21999,"journal":{"name":"Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/QELS.2007.4431777","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Scanning photocurrent measurements are demonstrated in individual carbon nanotube field effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.