Algorithms for the analysis of ultrathin samples with terahertz time domain spectroscopy

IF 1.8 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Infrared, Millimeter, and Terahertz Waves Pub Date : 2009-11-10 DOI:10.1109/ICIMW.2009.5324656

M. Scheller, C. Jansen, M. Koch

引用次数: 1

Abstract

We present a time domain and a frequency domain based algorithm for the analysis of spectroscopic terahertz data. The thickness information as well as the frequency dependent complex material parameters are extracted. Both methods can evaluate data obtained from measurements on sub-100µm thick samples, even in case of overlapping Fabry Perot echoes in the time domain. While the frequency domain approach provides highest accuracy, the time domain method is extremely computation efficient, enabling real time data extraction.

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用太赫兹时域光谱分析超薄样品的算法

提出了一种基于时域和频域的太赫兹光谱数据分析算法。提取了厚度信息和频率相关的复合材料参数。这两种方法都可以评估从低于100 μ m厚的样品测量中获得的数据，即使在时域重叠法布里佩罗回波的情况下。虽然频域方法提供了最高的精度，但时域方法的计算效率极高，能够实时提取数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Infrared, Millimeter, and Terahertz Waves 工程技术-工程：电子与电气

CiteScore

6.20

自引率

6.90%

发文量

审稿时长

3 months

期刊介绍： The Journal of Infrared, Millimeter, and Terahertz Waves offers a peer-reviewed platform for the rapid dissemination of original, high-quality research in the frequency window from 30 GHz to 30 THz. The topics covered include: sources, detectors, and other devices; systems, spectroscopy, sensing, interaction between electromagnetic waves and matter, applications, metrology, and communications. Purely numerical work, especially with commercial software packages, will be published only in very exceptional cases. The same applies to manuscripts describing only algorithms (e.g. pattern recognition algorithms). Manuscripts submitted to the Journal should discuss a significant advancement to the field of infrared, millimeter, and terahertz waves.