On the interpretation of electron diffraction patterns from materials containing planar boundaries: the intergrowth tungsten bronzes

G. Harburn, R. Tilley, R. Williams
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引用次数: 1

Abstract

Materials containing planar boundaries are of general interest and complete understanding of their structures is important. When direct imaging of the boundaries by, for instance, high-resolution electron microscopy, is impracticable, details of their structure and arrangement may be obtained from electron diffraction patterns. Such patterns are discussed in terms of those from intergrowth tungsten bronzes as specific examples. Fourier-transform calculations for proposed structures have been made to establish, in conjunction with optical-diffraction analogues, the features of the far-field diffraction patterns. These results have been compared with diffraction patterns obtained experimentally by transmission electron microscopy. The aim of the study, to show that the arrangement of the boundaries in these complicated phases can be deduced from their diffraction patterns without the need for high-resolution imaging, has been achieved. The steps to be taken to make these deductions are set out.
含平面边界材料的电子衍射图解释:共生钨青铜
包含平面边界的材料是人们普遍感兴趣的,对其结构的全面理解是很重要的。当直接成像的边界,例如,高分辨率的电子显微镜,是不可行的,他们的结构和安排的细节可以从电子衍射图获得。并以共生钨青铜的纹样为例进行了讨论。对所提出的结构进行了傅里叶变换计算,并结合光学衍射类似物,建立了远场衍射图案的特征。这些结果与透射电镜实验得到的衍射图进行了比较。研究的目的是表明,这些复杂相的边界排列可以从它们的衍射图样中推断出来,而不需要高分辨率的成像,已经实现了。列出了进行这些扣减所应采取的步骤。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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