Research on the SiC MOSFETs Short Circuit Detection and Protection optimization Method

Baowei Yu, Xizheng Guo, Xucong Bu, Jingjing Wu
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引用次数: 1

Abstract

In order to ensure the reliable operation of SiC MOSFETs, the short-circuit protection function is critical for the drive board. In this paper, the existing short-circuit protection methods are firstly analyzed and compared, which shows that the desaturation detection method is relatively easy to implement. Secondly, due to the weak short-circuit withstand capability, the traditional desaturation detection circuit is optimized. The parameters selection method and the detection delay time are analyzed in detail. Considering of the temperature sensitivity of drain-source voltage VDS, a temperature compensation desaturation detection circuit is proposed. Finally, the above analysis are verified through simulation and experimental results, which show that the total short-circuit protection time is less than 1 $\mu$s.
SiC mosfet短路检测与保护优化方法研究
为了保证SiC mosfet的可靠工作,短路保护功能对驱动板至关重要。本文首先对现有的短路保护方法进行了分析和比较,结果表明,去饱和检测方法相对容易实现。其次,由于传统的去饱和检测电路抗短路能力较弱,对其进行了优化。详细分析了参数选择方法和检测延时时间。考虑漏源电压VDS的温度敏感性,提出了一种温度补偿去饱和检测电路。最后,通过仿真和实验结果验证了上述分析,结果表明,总短路保护时间小于1 $\mu$s。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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