An efficient routing method for pseudo-exhaustive built-in self-testing of high-speed interconnects

Abstract

This paper presents a powerful routing method for pseudo-exhaustive built-in self-testing of high-speed interconnects with both capacitive and inductive crosstalk effects. Based on the concepts of test cone and cut-off locality, the routing method can generate an interconnect structure such that all nets can be tested by pseudoexhaustive patterns. The test pattern generation method is simple and efficient. Experimental results obtained by simulating a set of MCNC benchmarks demonstrate the feasibility of the proposed pseudo-exhaustive test approach and the efficiency of the proposed routing method.