Mechanical Stress Simulation of Thin Film Transistor on Flexible Substrate

S. Kong, Heetaek Lim, A. Hoessinger, E. Guichard
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引用次数: 1

Abstract

The mechanical stress in a thin-film transistor on flexible substrate is the most important problem in display industry. It causes to change electrical performance when bending, stretching, and other possible mechanical deformation stress are applied to film stack, or when repeated deformation is performed to thin film device on flexible substrate. There are few literatures to describe the mechanical stress calculation based on analytic calculation when bending moment is quite small and substrate is larger than film thickness, but this approach has a limitation to extend mechanically large deformed device on a flexible substrate. This motivates us to develop a comprehensive numerical stress model for simulating thin film transistor device on flexible substrate.
柔性基板上薄膜晶体管的机械应力模拟
柔性基板上薄膜晶体管的机械应力是显示工业中最重要的问题。当对薄膜堆施加弯曲、拉伸和其他可能的机械变形应力时,或对柔性基板上的薄膜装置进行重复变形时,会引起电性能的变化。在弯矩很小且基材大于薄膜厚度的情况下,基于解析计算的机械应力计算文献很少,但这种方法对在柔性基材上扩展机械大变形器件有一定的局限性。这促使我们开发一个全面的数值应力模型来模拟柔性衬底上的薄膜晶体管器件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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