X-ray diffraction line broadening in dry grinding of kaolinite

Abstract

The influence of dry milling on the crystalline microstructure of two kaolinites of different origins is studied by X-ray diffraction (XRD) and by analysing field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) images. Two methods of XRD microstructural analysis are used: the Voigt function and the Warren- Averbach methods; good linear correlation between average apparent crystallite size estimated by both methods is found.