Research on Clock Circuit Electromagnetic Emission Test and Suppression

Ba Yijie, Wu Shengnan
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Abstract

Clock circuit is an important part of PCB, which is usually composed of crystal oscillator, crystal oscillator control chip and capacitor. Electromagnetic emission generated by clock circuit is one of the main interference sources of electronic equipment. According to the different transmission paths, electromagnetic interference caused by clock circuit usually includes conduction interference and radiation interference. When the electromagnetic emission generated by the clock circuit reaches a certain degree, it may affect the electromagnetic compatibility of electronic equipment. In this paper, by analyzing the frequency spectrum characteristics of the clock signal, the difference of the frequency spectrum of the clock signal under different parameters is compared, and the electromagnetic emission test method is given. On this basis, when the EMI suppression method of clock circuit is studied, a series of EMC design methods of clock circuit are summarized, and the application of spread spectrum technology in clock circuit is proposed.
时钟电路电磁发射测试与抑制研究
时钟电路是PCB的重要组成部分,通常由晶体振荡器、晶体振荡器控制芯片和电容组成。时钟电路产生的电磁辐射是电子设备的主要干扰源之一。时钟电路产生的电磁干扰根据传输路径的不同,通常包括传导干扰和辐射干扰。当时钟电路产生的电磁发射达到一定程度时,可能会影响电子设备的电磁兼容性。本文通过分析时钟信号的频谱特性,比较了时钟信号在不同参数下的频谱差异,并给出了电磁发射测试方法。在此基础上,对时钟电路的电磁干扰抑制方法进行了研究,总结了时钟电路的一系列电磁兼容设计方法,并提出了扩频技术在时钟电路中的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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