Temperature dependence of reconfigurable bandstop filters using vanadium dioxide switches

A. Muller, M. Cavalieri, A. Ionescu
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引用次数: 2

Abstract

In this letter we report and investigate the temperature dependency of various radio frequency parameters (RF) for a fabricated reconfigurable bandstop filter with vanadium dioxide (VO2) switches measured up to 55 GHz. Here the insulator to metal (ITM) and metal to insulator transition (MIT) hysteresis of the VO2 thin film influence on the RF characteristics of the filters is analyzed from 25 °C and 120 °C in heating and cooling. The resonance frequency and maximum insertion loss (IL) stability and sensitivity with temperature variations are explored. It is noticed that increasing the temperature with 50 °C from 25 °C (or decreasing it with 50 °C from 120 °C) will result in a less than 1% fractional frequency shift in respect to the off and on resonance frequencies. The sharp DC conductivity levels variations of the VO2 thin film around the transition temperatures translate into sharp effects on the resonance characteristics of the filters. On the contrary, the maximum IL levels are less sensitive to the DC films sharp conductivity changes around the VO2 transition temperature. Last, we see that the RF parameters in heating and cooling at 80 °C, above (but close to) the DC transition temperatures of VO2 exhibit completely different resonance frequencies. The RF results reported close to the transition temperatures for the VO2 thin films can diverge in heating and cooling, thus of a more insightful understanding of VO2 reconfigurable RF devices has to include temperature dependent measurements at various temperatures below MIT and ITM in the RF ranges too
使用二氧化钒开关的可重构带阻滤波器的温度依赖性
在这封信中,我们报告并研究了各种射频参数(RF)对制造的可重构带阻滤波器的温度依赖性,其中二氧化钒(VO2)开关的测量频率高达55 GHz。本文分析了在25°C和120°C加热和冷却条件下,VO2薄膜的绝缘体到金属(ITM)和金属到绝缘体转变(MIT)迟滞对滤波器射频特性的影响。探讨了谐振频率和最大插入损耗随温度变化的稳定性和灵敏度。值得注意的是,温度从25°C增加50°C(或从120°C降低50°C)将导致相对于关闭和打开谐振频率的分数频率移位小于1%。VO2薄膜在转变温度附近的直流电导率水平的急剧变化转化为对滤波器谐振特性的急剧影响。相反,在VO2转变温度附近,最大IL电平对直流薄膜电导率的急剧变化不太敏感。最后,我们看到在80°C加热和冷却时,高于(但接近)VO2的直流转变温度的RF参数表现出完全不同的谐振频率。报告的射频结果接近VO2薄膜的转变温度,在加热和冷却时可能会出现分歧,因此,为了更深刻地理解VO2可重构射频器件,必须包括在RF范围内低于MIT和ITM的各种温度下的温度相关测量
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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