Structural and optical characterization of aluminum zinc co-doped tin oxide grown by sol-gel spin coating techniques

O. Adedokun, I. Bello, O. Adedeji, K. Talabi, O. Olatunji, R. Alasa
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Abstract

Aluminum Zinc co-doped Tin Oxide (AZSO) thin film was grown by sol-gel spin coating techniques onto a glass substrate using various doping concentrations (0, 2, 4, 6, and 8 wt%) and the effect of doping on each sample were studied using structural analysis; X-ray Diffraction (XRD) pattern, gravimetric method; thin film thickness and UV photo-spectrometer; optical properties. The results of the XRD were revealed that all the peaks have a tetragonal phase of SnO2, which were oriented at the 110, 101, and 211 planes. The film thickness was observed to vary with doping concentration. In the visible region, all the film samples were exhibited at average transmittance. The coefficient of absorption was gradually increased with an increase in photon energy at a certain level with a decrease in the absorption coefficient as the photon energy increases further. At 550-800 nm range of wavelength, a high extinction coefficient (k) was recorded and the refractive index curves show regular dispersion behavior. The optical conductivity of the films followed a similar pattern, which showed that conductivity increased to a peak at 3.60 eV. The energy bandgap of the film samples (AZSO1 - AZSO5) is 4.095 eV, 4.103 eV, 4.087 eV, 4.114 eV, and 4.106 eV, respectively. The studies show that the properties of Al-Zn co-doped SnO2 films can be explored for optoelectronic applications.
溶胶-凝胶自旋镀膜技术制备铝锌共掺杂氧化锡的结构和光学特性
采用溶胶-凝胶自旋镀膜技术在玻璃基板上生长铝锌共掺杂氧化锡(AZSO)薄膜,并采用结构分析研究了不同掺杂浓度(0、2、4、6和8 wt%)对每个样品的影响;x射线衍射(XRD)图,重量法;薄膜厚度与紫外分光计;光学性质。XRD分析结果表明,所有峰均为SnO2的四方相,分别在110、101和211面取向。观察到薄膜厚度随掺杂浓度的变化而变化。在可见光区,所有薄膜样品均表现为平均透过率。吸收系数在一定水平上随光子能量的增加而逐渐增大,随光子能量的进一步增加而减小。在550 ~ 800 nm波长范围内,测量到较高的消光系数k,折射率曲线表现出规律的色散行为。薄膜的电导率也呈现出相似的规律,电导率在3.60 eV时达到峰值。薄膜样品(AZSO1 - AZSO5)的能带隙分别为4.095 eV、4.103 eV、4.087 eV、4.114 eV和4.106 eV。研究表明,Al-Zn共掺杂SnO2薄膜的性能可用于光电应用。
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