Исследование ван-дер-ваальсовых кристаллов GaSe и GaS-=SUB=-x-=/SUB=-Se-=SUB=-1-x-=/SUB=- методом фотоотражения

С.А. Хахулин, К. А. Кох, О. С. Комков
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Abstract

Photoreflectance spectra of layered undoped GaSe and GaSxSe1-x crystals present Franz — Keldysh oscillations indicating the near-surface built-in electric field, that can participate in the separation of photoinduced charge carriers in ultrahigh-sensitive photodetectors based on these materials. The measured value of the field strength in GaSxSe1-x turned out to be almost 1.5 times less than in GaSe, that may indicate a smaller number of free charge carriers in the solid solution. The broadening parameter of GaSxSe1-x spectral lines is also significantly lower than in the case of GaSe. This is due to the fact that isovalent atoms, being added into the GaSe, fill Ga vacancies, reducing the number of defects and the concentration of intrinsic charge carriers. The high-field modulation mode observed in the photoreflectance spectrum of GaSxSe1-x doped with an Al donor impurity indicates a relatively small thickness of the depletion region due to the presence of a large number of free electrons.
层状未掺杂GaSe和GaSxSe1-x晶体的光反射光谱呈现Franz - Keldysh振荡,表明在基于这些材料的超高灵敏度光电探测器中,近表面内置电场可以参与光诱导载流子的分离。GaSxSe1-x的场强测量值几乎是GaSe的1.5倍,这可能表明固溶体中的自由载流子数量较少。GaSxSe1-x谱线的展宽参数也明显小于GaSe。这是由于同价原子被加入到GaSe中,填补了Ga空位,减少了缺陷的数量和本然载流子的浓度。在掺有Al给体杂质的GaSxSe1-x的光反射光谱中观察到的高场调制模式表明,由于存在大量自由电子,耗尽区厚度相对较小。
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