{"title":"The atomic fingerprint of YBa2Cu3O7−x-type high-temperature superconductors observed by field ion microscopy","authors":"A.J Melmed, R.D Shull, C.K Chiang, H.A Fowler","doi":"10.1016/0025-5416(88)90273-X","DOIUrl":null,"url":null,"abstract":"<div><p>The high-transition-temperature superconducting oxides YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−<em>x</em></sub>, YbBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−<em>x</em></sub>, SmBa<sub>2</sub>Cu<sub>3</sub>-O<sub>7−<em>x</em></sub>, GdBa<sub>2</sub>(Cu<sub>0.96</sub>Fe<sub>0.04</sub>)<sub>3</sub>O<sub>7−<em>x</em></sub>, and GdBa<sub>2</sub>(Cu<sub>0.92</sub>Fe<sub>0.08</sub>)<sub>3</sub>O<sub>7−<em>x</em></sub> (0<<em>x</em><0.5) have been found to exhibit a common, unusual but characteristic field ion microscope image at low temperatures. This type of image has been attributed to inhomogeneous field evaporation, field ionization or both, and results in parallel rows of preferentially imaged atoms. The characteristically striated images in these materials enable identification of various lattice defects such as dislocations, twin boundaries and grain boundaries.</p></div>","PeriodicalId":100890,"journal":{"name":"Materials Science and Engineering","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1988-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0025-5416(88)90273-X","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/002554168890273X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The high-transition-temperature superconducting oxides YBa2Cu3O7−x, YbBa2Cu3O7−x, SmBa2Cu3-O7−x, GdBa2(Cu0.96Fe0.04)3O7−x, and GdBa2(Cu0.92Fe0.08)3O7−x (0<x<0.5) have been found to exhibit a common, unusual but characteristic field ion microscope image at low temperatures. This type of image has been attributed to inhomogeneous field evaporation, field ionization or both, and results in parallel rows of preferentially imaged atoms. The characteristically striated images in these materials enable identification of various lattice defects such as dislocations, twin boundaries and grain boundaries.
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