Evaluation system of product maturity level for the third generation semiconductor microwave device based on Web

Abstract

Aiming at the exigent need of product maturity level evaluation for the third generation semiconductor microwave device and the shortages of current domestic and foreign evaluation methods, this paper extends the traditional Technology Readiness Level (TRL) evaluation method roundly from technology integration and technology dimension, establishes a structural describing and measuring model for product maturity, proposes a quantitative computing method based on questionnaire mode using Analytic Hierarchy Process (AHP) and attribute mathematics, builds a product maturity level evaluation system for the third generation semiconductor microwave device based on Web, and at last realizes an all-round evaluation of product maturity objectively and effectively.