Influence of Mn2+ Magnetic Ions on the Properties of Cd1 – xMnxS Thin Films Synthesized by Chemical Bath Deposition

A. Mali, A. Gaikwad, S. Borse, R. R. Ahire
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Abstract

II-VI semiconductor based ternary CdMnS compound material has received more attention due to its wide area of applications in semiconductor technology. Cd 1 – x Mn x S ( x  0, 0.2, 0.4, 0.6, 0.8 and 1.0) thin films were successfully prepared by chemical bath deposition technique on non-conducting glass substrates. Thin films were deposited at a bath temperature of 80  C and pH  11 by using the chemical bath reaction of cadmium chloride (CdCl 2 ) and manganese chloride (MnCl 2 ) with thiourea (NH 4 ) 2 S in an aqueous solution. Further, the prepared samples were characterized by UV-visible spectroscopy, photoluminescence, XRD, SEM and EDAX to study the optical, structural, surface, and chemical properties. Effect of Mn 2+ ions on the film thickness of Cd 1 – x Mn x S films was investigated using weight difference technique. The film thickness of Cd 1 – x Mn x S films decreases as Mn 2+ ions increase in the bath solution. The polycrystalline nature with hexagonal and cubic structures of the as-deposited films was confirmed by XRD. The band gap value of the deposited films was observed to increase with increasing Mn 2+ ion concentration, this might be ascribed to the fact that Cd atom was substituted by Mn atom in the CdS structure. EDAX analysis confirmed the deposition of Cd, Mn and S elements in the films. Photoluminescence spectra of Cd 1 – x Mn x S with different values of the composition parameter x exhibited two emission peaks with different intensities. The measurement of the electrical resistivity of Cd 1 – x Mn x S films was performed at room temperature using two probe methods. The variation in electrical resistivity values with compositional parameters was discussed based on deposition parameters. The investigated polycrystalline Cd 1 – x Mn x S thin films show promising technological applications in semiconductor industry.
Mn2+磁性离子对化学镀液法制备Cd1 - xMnxS薄膜性能的影响
II-VI半导体基三元CdMnS复合材料因其在半导体技术中的广泛应用而受到越来越多的关注。采用化学浴沉积技术在非导电玻璃衬底上成功制备了Cd 1 - x Mn x S (x0,0.2,0.4,0.6,0.8和1.0)薄膜。采用氯化镉(CdCl 2)和氯化锰(MnCl 2)与硫脲(nh4) 2s在水溶液中进行化学浴反应,在温度为80℃,pH为11的条件下沉积薄膜。通过紫外可见光谱、光致发光、XRD、SEM和EDAX等手段对制备的样品进行表征,研究其光学、结构、表面和化学性质。采用质量差法研究了Mn +离子对cd1 - x Mn x S薄膜厚度的影响。随着溶液中Mn +离子的增加,Cd - x Mn x S薄膜的膜厚减小。通过x射线衍射(XRD)证实了沉积膜具有六方和立方结构的多晶性质。薄膜的带隙值随着Mn +浓度的增加而增大,这可能是由于Cd结构中的Cd原子被Mn原子取代所致。EDAX分析证实薄膜中有Cd、Mn和S元素的沉积。不同组成参数x值的Cd - x Mn x S的光致发光光谱呈现出两个不同强度的发射峰。采用两种探针法在室温下测量了cd1 - x Mn x S薄膜的电阻率。以沉积参数为基础,讨论了电阻率值随组成参数的变化规律。所研究的多晶cd1 - x Mn x S薄膜在半导体工业中具有广阔的应用前景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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