{"title":"X-ray diffraction method for quantitative estimation of elastic modulus in materials with gradient structure","authors":"M. Ostapenko, L. Meisner","doi":"10.1063/1.5132124","DOIUrl":null,"url":null,"abstract":"The efficiency of X-ray diffraction (XRD) method for quantitative estimation of elastic modulus in materials with gradient structure have been demonstrated in the paper. This method was used to calculate the elastic modulus for NiTi samples irradiated at a beam energy E= 15 J/cm2 and pulse duration τ = 150 µsx. It is determined that the compared values of XRD elastic modulus E(hkl, ψ) and elastic modulus En obtained for the same samples by nanoindentation are close.The efficiency of X-ray diffraction (XRD) method for quantitative estimation of elastic modulus in materials with gradient structure have been demonstrated in the paper. This method was used to calculate the elastic modulus for NiTi samples irradiated at a beam energy E= 15 J/cm2 and pulse duration τ = 150 µsx. It is determined that the compared values of XRD elastic modulus E(hkl, ψ) and elastic modulus En obtained for the same samples by nanoindentation are close.","PeriodicalId":20637,"journal":{"name":"PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS WITH HIERARCHICAL STRUCTURE FOR NEW TECHNOLOGIES AND RELIABLE STRUCTURES 2019","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS WITH HIERARCHICAL STRUCTURE FOR NEW TECHNOLOGIES AND RELIABLE STRUCTURES 2019","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.5132124","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The efficiency of X-ray diffraction (XRD) method for quantitative estimation of elastic modulus in materials with gradient structure have been demonstrated in the paper. This method was used to calculate the elastic modulus for NiTi samples irradiated at a beam energy E= 15 J/cm2 and pulse duration τ = 150 µsx. It is determined that the compared values of XRD elastic modulus E(hkl, ψ) and elastic modulus En obtained for the same samples by nanoindentation are close.The efficiency of X-ray diffraction (XRD) method for quantitative estimation of elastic modulus in materials with gradient structure have been demonstrated in the paper. This method was used to calculate the elastic modulus for NiTi samples irradiated at a beam energy E= 15 J/cm2 and pulse duration τ = 150 µsx. It is determined that the compared values of XRD elastic modulus E(hkl, ψ) and elastic modulus En obtained for the same samples by nanoindentation are close.