Self-detectable serial test vector for short circuit fault detection

Abstract

The design of the maximum number of serial test vectors is proposed for the detection of the short circuit faults of the interconnect wires. The interconnect wires of the circuit board is reconfigured and mapped into several net groups, which are electrically independent from each other. The short circuit faults between the independent net groups generate the responses which is the result of wired-OR or wired-AND operation of the applied test vector sets to the net groups. The test vector is self-detectable if the responses from the faulty net group are different from any set of the applied test vector sets and the short circuit faults are detected by observing the response of the circuit. For the self-detectable vector sets, the previous methods showed the reduced the number of the test vector set. We proposed the maximum number of self-detectable test vector sets and compared with the previous test vector sets.