Matching Considerations for Bidirectional Current Mirrors

I. Siegl, Markus Haberler, C. Steffan
{"title":"Matching Considerations for Bidirectional Current Mirrors","authors":"I. Siegl, Markus Haberler, C. Steffan","doi":"10.1109/Austrochip.2019.00023","DOIUrl":null,"url":null,"abstract":"This paper elaborates in detail which matching dynamics occur when mirroring bidirectional currents. Formulas for the matching error of bidirectional current mirrors are deduced from the unidirectional case. Simulation results confirm these calculations and verify that the matching degradation due to the bidirectional nature is stronger than the degradation due to the transistor coming into weak inversion. Depending on whether or not calibration is acceptable the paper states suitable design considerations.","PeriodicalId":6724,"journal":{"name":"2019 Austrochip Workshop on Microelectronics (Austrochip)","volume":"1 1","pages":"65-70"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Austrochip Workshop on Microelectronics (Austrochip)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/Austrochip.2019.00023","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper elaborates in detail which matching dynamics occur when mirroring bidirectional currents. Formulas for the matching error of bidirectional current mirrors are deduced from the unidirectional case. Simulation results confirm these calculations and verify that the matching degradation due to the bidirectional nature is stronger than the degradation due to the transistor coming into weak inversion. Depending on whether or not calibration is acceptable the paper states suitable design considerations.
双向电流镜的匹配考虑
本文详细阐述了双向电流镜像时的匹配动态。从单向情况出发,推导了双向电流镜匹配误差的计算公式。仿真结果证实了这些计算,并验证了由于双向特性引起的匹配退化比由于晶体管进入弱反转引起的退化更强。根据是否可接受校准,论文阐述了适当的设计考虑因素。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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