{"title":"Defect concentration measurements in solids using a lyoluminescence method","authors":"Yu.E. Avotinsh , Yu.R. Dzelme , Yu.Ye. Tiliks , L.T. Bugaenko , V.I. Gotlib , T.Ye. Kreishmane","doi":"10.1016/0020-708X(85)90029-8","DOIUrl":null,"url":null,"abstract":"<div><p>The dependence of alkali halide crystal lyoluminescence on crystal lattice defect concentration has been studied using the rotating-disk method. It is shown that lyoluminescence intensity changes in proportion to changes of F-center concentration in a crystal. It is also demonstrated that by gradually dissolving the crystal in the form of a disk, while rotating it with a constant angular rate around its axis of symmetry, it is possible to determine the defect distribution over the crystal depth with a resolution of the order of 1 μm according to measurements of lyoluminescence intensity.</p></div>","PeriodicalId":22517,"journal":{"name":"The International journal of applied radiation and isotopes","volume":"36 10","pages":"Pages 789-791"},"PeriodicalIF":0.0000,"publicationDate":"1985-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0020-708X(85)90029-8","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The International journal of applied radiation and isotopes","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0020708X85900298","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The dependence of alkali halide crystal lyoluminescence on crystal lattice defect concentration has been studied using the rotating-disk method. It is shown that lyoluminescence intensity changes in proportion to changes of F-center concentration in a crystal. It is also demonstrated that by gradually dissolving the crystal in the form of a disk, while rotating it with a constant angular rate around its axis of symmetry, it is possible to determine the defect distribution over the crystal depth with a resolution of the order of 1 μm according to measurements of lyoluminescence intensity.